Towards Characterizing Adversarial Defects of Deep Learning Software from the Lens of Uncertainty

Published in Proceedings of the 42nd IEEE/ACM International Conference on Software Engineering, 2020

Recommended citation: Xiyue Zhang, Xiaofei Xie, Lei Ma, Xiaoning Du, Qiang Hu, Yang Liu, Jianjun Zhao, Meng Sun. "Towards Characterizing Adversarial Defects of Deep Learning Software from the Lens of Uncertainty." Proceedings of the 42nd IEEE/ACM International Conference on Software Engineering. ICSE 2020. https://arxiv.org/abs/2004.11573